Catalysis Database

Ion-induced carbide formation of TiFe: evidence from XPS and AES studies

P, Selvam and B, Viswanathan and V, Srinivasan (1990) Ion-induced carbide formation of TiFe: evidence from XPS and AES studies. Journal of the Less-Common Metals 161(1990) 77-85, 161 . pp. 77-85.

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Abstract

X-ray photoelectron and Auger electron spectroscopic studies on TiFe demonstrate that ion bombardment of the alloy not only results in sputter cleaning or even destruction of the surface but also leads to the formation of compact carbide layers. Such carbide species are of considerable importance in elucidating the reaction mechanism of hydrocarbon synthesis. They are also expected to play a significant role in the hydrogen sorption properties of materials. A better understanding of the nature of sputtered carbon is needed for its use as protective (against corrosion) thin films in magnetic recording applications. A comparison of photoelectron and Auger electron spectra of the surface carbides of TiFe would also be of interest since it is unusual for both types of data to be produced on the same samples where chemical shifts are involved.

Item Type:Article
Subjects:Science > Chemistry
ID Code:389
Deposited By: Dr S Navaladian
Deposited On:19 Mar 2007 21:27
Last Modified:19 Mar 2007 21:27

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